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Phabrix White Paper: Using Pseudo-Random Binary Sequences to Stress Test Serial Digital Interfaces

2019-02-15  |  White Papers
Phabrix: Using Pseudo-Random Binary Sequences to Stress Test Serial Digital Interfaces

Using Pseudo-Random Binary Sequences to Stress Test Serial Digital Interfaces


The easiest way to accomplish network visibility is to implement a visibility architecture—which is an end-to-end infrastructure that enables physical and virtual network, application, and security visibility.


In the latest white paper by Phabrix, the use of Pseudo-Random Binary Sequences (PRBS) is discussed, along with bit-error rate tests (BERT) to provide a more flexible and complete method of stress testing serial digital interfaces.


In this whitepaper, PHABRIX discusses the use of pseudo-random binary sequences (PRBS - also referred to as pseudo-random bit sequences), along with bit-error rate tests (BERT – also referred to as bit-error ratio tests) to stress test serial digital interfaces. The purpose of any physical layer serial digital interface (PHY) is to transmit or receive data whilst preserving that data’s integrity. In practical systems the major cause of bit-errors is random noise. To stress test such systems, it is necessary to both generate a “noisy” bit stream and then analyse the output from the interface to determine the bit-error rate which represents the integrity of the data.



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Phabrix White Paper: Using Pseudo-Random Binary Sequences to Stress Test Serial Digital Interfaces







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