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Events & Training
Leader Instruments: IP 101 Webinar Series - Part 3 - Timing & IP Jitter
Categories: WebinarsIf IP packets arrive too fast or too slow, you get jitter. In Leader’s next webinar, Steve Holmes and Kevin Salvidge will reveal how to avoid jitter, and the best ways to troubleshoot when it happens.
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VIAVI Wireless: Understanding 5G – What We've Seen From Lab-to-Field
Learn how to make the 5G transition, boost your 5G network performance and quality and differentiate your customer experience.
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Anritsu: Protecting Critical Communications Systems from Interference
This webinar will discuss various methods and tools needed to quickly and easily hunt, track, identify, and remove interference utilizing Anritsu’s Field Master Pro MS2090A high-performance spectrum analyzer.
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Y.I.C. Technologies: EMI/EMC Design and Troubleshooting with Near Field Scanning Tools
Categories: WebinarsThis webinar will teach you about the fundamentals of practical EMI/EMC design and troubleshooting of electronic circuits using field scanning tools.
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Teledyne LeCroy: EMC / ESD Pulse Measurements Using Oscilloscopes
Categories: WebinarsThe digital oscilloscope has become the most commonly used test tool on the EMC engineer’s bench, but most engineers use only a fraction of the power available in these instruments.
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Ametek CTS: Introduction to EMC Testing on Electric Vehicles
Categories: WebinarsRegister for the latest Ametek CTS webinar, and get an overview of the EMC standards requirements, and test procedures that apply to electric vehicles.
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Teledyne LeCroy: SI/PI on a Budget: Five Tricks to Get More out of your Oscilloscope
Categories: WebinarsIn this free webinar from Teledyne LeCroy, Eric Bogatin will show you the right way you can do five common SI and PI measurements with a budget scope and some simple probes you probably already have around.
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Luna - Accelerate Silicon Photonics Development with Advanced Testing and Automation
Categories: WebinarsTags: luna technologiesThis webinar will describe Luna's advanced approach to silicon photonics testing and Maple Leaf Photonics' modular and flexible platform for automated testing of dies, and how these two technologies integrate into an effective complete solution for silicon photonics.
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Ametek CTS: Dropout Testing - Are you doing it wrong?
Categories: WebinarsFor Dropout Testing, different test setups and confusion about the intent of the standard can result in different results and behaviour of the device under test during the simulation.
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Teledyne LeCroy: S-Parameter Master Class - Hands on Lab Webinar: 3-Part Series
Categories: WebinarsIn this three-part interactive webinar series, Eric Bogatin will show you how to datamine S-parameters to reveal their secrets about interconnects.
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