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Zeroing in on Active, Passive, and Opto-Electronic Measurements
Categories: WebinarsThis webinar will delve into important fundaments that need to be followed when making VNA measurements at higher frequencies as well as discuss techniques for O/E devices
Read moreLuna: An Overview of Polarization Extinction Ratio Measurement Methods
Categories: White PapersPolarization extinction ratio (PER) is a measure of the degree to which light is confined in a principal linear polarization mode.
Read moreMPI Corporation: Tiny PICs with Huge Impact: Meeting the Challenges of Photonic Integrated Circuits Testing for Next-Generation Networks
Optical testing at the wafer level is currently a major bottleneck in component manufacturing due to tighter tolerances in optical testing compared to electrical testing, accounting for 80 percent of the test and assembly cost of the final product.
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